Recent Publications
(Highlighted items may be viewed using Adobe Acrobat Reader)

  1. Temperature Dependence of the Magnetoresistance in Co/Re Superlattices on Al2O3 (1120), T. Charlton and D. Lederman, Phys. Rev. B 63, 94404 (2001). (File).
  2. Growth Study of Epitaxial FexZn1-xF2 Thin Films, J. McChesney, M. Hetzer, H. Shi, T. Charlton, and D. Lederman, J. Mater. Res. (accepted).
  3. Annealed Co thin films: pit formation and magnetic anisotropy, H. Shi and D. Lederman, J. Appl. Phys. 87, 6095 (2000).(File)
  4. Occasional "long-range" nonequilibrium body-centered-cubic structures in NiFe/Cu spin valves, H. Geng, J. W. Heckman, W. P. Pratt, J. Bass, F. J. Espinosa, S. D. Conradson, D. Lederman, and M. A. Crimp, J. Appl. Phys. 86, 4166 (1999).(File)
  5. Anisotropy of the sublattice magnetization and magnetoresistance in Co/Re Multilayers on Al2O3(1120), T. Charlton, D. Lederman, S. M. Yusuf, and G. P. Felcher, J. Appl. Phys. 85, 4436 (1999).(File)
  6. Magnetic Properties of Co/Re hcp(1010) Superlattices, T. Charlton, J. McChesney, D. Lederman, F. Zhang, J. Z. Hilt, and M. J. Pechan, Phys. Rev. B 59, 11897 (1999). (File)
  7. Role of the Interface Structure in Exchange Bias, J. Nogués, T. J. Moran, D. Lederman, and I. K. Schuller, Phys. Rev. B 59, 6984 (1999).(File)
  8. Surface Smoothing and Crystalline Reorientation in Thin Cobalt Films, H. T. Shi and D. Lederman, Phys. Rev. B 58, R1778 (1998). (File)
  9. Surface roughness of metallic films probed by resistivity measurements, A. L. Cabrera, W. Garrido-Molina, E. Morales-Leal, J. Esponosa-Gangas, I. K. Schuller, and D. Lederman, Langmuir 14, 3249 (1998).
  10. Surface adsorption and bulk diffusion in metallic films sensed by resistivity change, R. Aguayo, J. Espinosa, W. Garrido, A. L. Cabrera, D. Lederman, and I. K. Schuller, Revista Mexicana de Física 44, 1 (1998).
  11. Competition between direct exchange and indirect RKKY coupling in Fe/V(001) superlattices, G. R. Harp; M. M. Schwickert; M. A. Tomaz; Tao Lin; D. Lederman,.; E. Mayo, and W. L. O'Brien, IEEE Trans. Magn. 34, 864 (1998).
  12. Magnetic Moments, Coupling, and Interface Interdiffusion in Fe/V(001) Multilayers, M. M. Schwickert, R. Coehoorn, M. A. Tomaz, D. Lederman, E. Mayo, W. L. O'Brien, Tao Lin, and G. R. Harp, Phys. Rev. B 57, 13681 (1998).
  13. Magnetic Properties of Co/Rh (001) Multilayers Studied by X-ray Magnetic Circular Dichroism, M. A. Tomaz, E. Mayo, D. Lederman, E. Hallin, T. K. Sham, W. L. O’Brien, and G. R. Harp, Phys. Rev. B 58, 11493 (1998). (File)
  14. Evolution of Strain-Dependent Transport Properties in Ultra Thin La0.67Sr0.33MnO3 Films, H. L. Ju, K. M. Krishnan, and D. Lederman, J. Appl. Phys. 83, 7073 (1998).
  15. Structural and Magnetic Properties of Fe/Rh (001) Sputter Deposited Multilayers, M. A. Tomaz, G. R. Harp, E. Mayo, D. Lederman, R. Wu, and W. L. O'Brien, J. Vac. Sci. Technol. A 16, 1336 (1998).
  16. Fe/Rh (100) Multilayer Magnetism Probed by XMCD, M. A. Tomaz, G. R. Harp, D. Lederman, E. Mayo, and W. L. O’Brien, Phys. Rev. B. 56, 5474 (1997).
  17. Surface Morphology of GaN Films Determined From Quantitative X-Ray Reflectivity, D. Lederman, Z. Yu, T. H. Myers, and M. R. Richards-Babb, Appl. Phys. Lett. 71, 368 (1997). (File)
  18. Resistance Change of Cobalt and Niobium Films When Exposed to Hydrogen and Carbon Monoxide, A. L. Cabrera, W. Garrido-Molina, J. Colino, D. Lederman, and I. K. Schuller, Phys. Rev. B 55, 13999 (1997).
  19. Structure and Magnetism of Epitaxial Rare-Earth-Transition-Metal Films, E.E. Fullerton, C.H. Sowers, J.E. Pearson, S.D. Bader, J.B. Patel, X.Z. Wu, and D. Lederman, J. Appl. Phys. 81, 5637 (1997).
  20. Structure and Magnetism of Epitaxial Rare-Earth-Transition-Metal Films, E. E. Fullerton, C. H. Sowers, J. P. Pearson, X. Z. Wu, D. Lederman, and S. D. Bader, in Magnetic Hysteresis in Novel Materials, ed. G. C. Hadjipanayis (Kluwer Academic Publishers, The Netherlands, 1997) 467.
  21. A General Approach to the Epitaxial Growth of Rare-Earth-Transition-Metal Films, E. E. Fullerton, C. H. Sowers, J. P. Pearson, S. D. Bader, X. Z. Wu and D. Lederman, Appl. Phys. Lett. 69, 2438 (1996).